These restrictions are required to ensure safe operation and protect both the chamber and the operator.
Specifications| Temperature range of test area | -40℃~150℃, -60℃~150℃, -65℃~150℃ ( optional) |
| High temperature range: +60℃~150℃ | |
| Low temperature range: -10℃~150℃ | |
| Testing environment conditions | Ambient temperature: +28 ℃ Relative humidity: ≤ 85% Conditions measured with no sample inside the test chamber |
| Preheating temperature range | +60℃~+150℃ |
| Heating-up time | +60 ℃ → +150 ℃: ≤ 40 min Note: Performance measured with the high-temperature chamber operating independently. |
| Low temperature chamber | Note: The heating-up time listed above refers to the performance of the high-temperature chamber operating independently. |
| Precooling temperature range | -55℃~-10℃ |
| Cooling time | +20 ℃ → –55 ℃: ≤ 70 min Note: Cooling performance is measured with the low-temperature chamber operating independently. |
| Testing method | Switches between two or three temperature zones using a pneumatic ventilation door. |
| Temperature shock range | -40℃~+150℃ |
| Temperature fluctuation | ±0.5℃ |
| Temperature departure | ±2.0℃ |
| Temperature recovery time | ≤ 5min |
| Recovery condition (Chart One) | Sample: plastic-packaged integrated circuit (uniformly distributed) Sensor position: upper side of the sample High-temperature exposure: +150 ℃ for 30 minutes Environment-temperature exposure: — Low-temperature exposure: –40 ℃ for 30 minutes Sample weight: 2.5 kg |